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Radiation-resistant device phenomenaAluminum oxide thin metal film for electron transport measurements
Document ID
19650014694
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Follmer, W. C.
(Philco Corp. Blue Bell, PA, United States)
Kane, W. M.
(Philco Corp. Blue Bell, PA, United States)
Date Acquired
August 2, 2013
Publication Date
February 1, 1965
Subject Category
Physics, Atomic, Molecular, And Nuclear
Report/Patent Number
NASA-CR-62822
Report Number: NASA-CR-62822
Accession Number
65N24295
Funding Number(s)
CONTRACT_GRANT: NASW-997
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
TRANSPORT
THIN FILM
ELECTRON
ALUMINUM OXIDE
METAL FILM
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