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Solar absorptance and thermal emittance of evaporated metal films with and without sur- face coatingsEffects of evaporation rate and oxygen pressure on characteristics of silicon oxide films, and angular reflectance of metals determined by optical constants
Document ID
19650017275
Acquisition Source
Headquarters
Document Type
Other
Authors
Georg Hass (United States Army Engineer Research and Development Laboratories Fort Belvoir, VA, United States)
Date Acquired
August 2, 2013
Publication Date
January 1, 1965
Publication Information
Publication: Symposium on Thermal Radiation of Solids
Publisher: National Aeronautics and Space Administration
Subject Category
Thermodynamics And Combustion
Meeting Information
Meeting: Symposium on Thermal Radiation of Solids
Location: San Francisco, CA
Country: US
Start Date: March 4, 1964
End Date: March 6, 1964
Sponsors: National Aeronautics and Space Administration, National Bureau of Standards
Accession Number
65N26876
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
EVAPORATION RATE
OPTICAL PROPERTY
PRESSURE EFFECT
METAL
SILICON OXIDE
FILM
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