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Evaluation test performed by librascope reli- ability department on texas instrument solid circuits, types sn510, sn512, and sn515, volume 1Thermal, life, and mechanical environment effects on solid integrated circuits of diffused silicon
Document ID
19650020864
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Swygard, G. F. (Librascope, Inc. Glendale, CA, United States)
Trempe, L. E. (Librascope, Inc. Glendale, CA, United States)
Date Acquired
August 2, 2013
Publication Date
March 10, 1965
Subject Category
Electronic Equipment
Report/Patent Number
TR-7-0024
NASA-CR-64135
Report Number: TR-7-0024
Report Number: NASA-CR-64135
Accession Number
65N30465
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
SILICON
ENVIRONMENTAL TESTING
INTEGRATED CIRCUIT

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