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Performance of mark 1 sampler mechanismsSampling device evaluation from X-ray diffraction patterns
Document ID
19650025361
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Nash, D. B. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 2, 2013
Publication Date
June 1, 1965
Subject Category
Machine Elements And Processes
Accession Number
65N34962
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
DIFFRACTION PATTERN
X-RAY DIFFRACTION
SAMPLING DEVICE
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