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Chemical analysis of surfaces using alpha particles.Chemical analysis of surfaces using alpha-particle interactions from curium 242 sources and semiconductor silicon detectors
Document ID
19650039749
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Franzgrote, E.
Patterson, J. H.
Turkevich, A. L.
Date Acquired
August 2, 2013
Publication Date
March 15, 1965
Subject Category
Chemistry
Accession Number
65A22453
Funding Number(s)
CONTRACT_GRANT: NSG-127-61
Distribution Limits
Public
Copyright
Other
Keywords
ALPHA RADIATION
SCATTERING CROSS SECTION
SILICON RADIATION DETECTOR
SURFACE CHEMISTRY

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