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High resolution dark field microscopy using a philips 100b electron microscope.Electron microscope producing dark field images without resolution loss, using primary beam electrical tilting
Document ID
19650042014
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Cinquina, L.
Meakin, J. D.
Date Acquired
August 2, 2013
Publication Date
May 1, 1965
Subject Category
Instrumentation And Photography
Accession Number
65A24718
Funding Number(s)
CONTRACT_GRANT: NASR-145
Distribution Limits
Public
Copyright
Other
Keywords
IMAGE CONTRAST
ELECTRON MICROSCOPE

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