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Highly sensitive solids mass spectrometer uses inert-gas ion sourceMass spectrometer provides a recorded analysis of solid material surfaces and bulk. A beam of high-energy inert-gas ions bombards the surface atoms of a sample and converts a percentage into an ionized vapor. The mass spectrum analyzer separates the vapor ionic constituents by mass-to-charge ratio.
Document ID
19660000113
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 3, 2013
Publication Date
March 1, 1966
Subject Category
Physical Sciences
Report/Patent Number
ERC-11
Report Number: ERC-11
Accession Number
66B10114
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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