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Dielectrometer design permits measurement in vacuum under irradiationDielectrometer permits measurement of dielectric constant and dielectric losses in a vacuum environment exposed to radiation. It is not necessary to remove the sample from the chamber during testing.
Document ID
19660000400
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 3, 2013
Publication Date
September 1, 1966
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-359
Report Number: MFS-359
Accession Number
66B10401
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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