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Theoretical and experimental studies of the underlying processes and techniques of low pressure measurement Semiannual status report, Sep. 1, 1964 - Feb. 28, 1965Pumping of getter-ion pumps at low pressure, crossed field mass spectrometer, secondary electron emission, angular distribution of Auger electrons, and gaseous adsorption
Document ID
19660006692
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Propst, F. M.
(Illinois Univ. Urbana, IL, United States)
Date Acquired
August 3, 2013
Publication Date
July 1, 1965
Subject Category
Facilities, Research, And Support
Report/Patent Number
NASA-CR-69654
Report Number: NASA-CR-69654
Accession Number
66N15981
Funding Number(s)
CONTRACT_GRANT: NSG-376
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
CROSSED FIELD
SECONDARY EMISSION
ELECTRON EMISSION
ADSORPTION
MASS SPECTROMETER
ANGULAR DISTRIBUTION
ION PUMP
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