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Metal-oxide semiconductor stability studies - Capacitance-voltage measurements Final reportElectrophysical instabilities of metal oxide semiconductors determined by capacitance-voltage curve analysis
Document ID
19660010639
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
August 3, 2013
Publication Date
January 1, 1965
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-71030
Report Number: NASA-CR-71030
Accession Number
66N19928
Funding Number(s)
CONTRACT_GRANT: NAS5-3758
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
CAPACITANCE
ELECTRIC PROPERTY
METAL OXIDE SEMICONDUCTOR /MOS/

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