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Design development, fabrication, and delivery of improved MOS transistors Third quarterly progress report, 22 Nov. 1965 - 21 Feb. 1966Instability, high threshold voltage and gamma radiation sensitivity of metal-oxide-silicon transistors
Document ID
19660014349
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Schlegel, E. S.
(Philco Corp. Lansdale, PA, United States)
Date Acquired
September 2, 2013
Publication Date
January 1, 1966
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-74292
Report Number: NASA-CR-74292
Accession Number
66N23638
Funding Number(s)
CONTRACT_GRANT: NAS8-11926
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
SILICON TRANSISTOR
GAMMA RADIATION
METAL OXIDE
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