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Research to determine failure modes for transistorsFailure modes of diffused planar transistors under stress screening and life testing
Document ID
19660017555
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Bair, B. (ED)
Date Acquired
August 3, 2013
Publication Date
January 1, 1965
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-75304
Report Number: NASA-CR-75304
Accession Number
66N26845
Funding Number(s)
CONTRACT_GRANT: NAS8-11059
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
FAILURE MODE
TRANSISTOR
RELIABILITY
STRESS ANALYSIS

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