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A high resolution secondary emission spectrometer for surface researchHigh resolution spectrometer for crystal surface research using secondary, elastically scattered electrons
Document ID
19660019502
Acquisition Source
Legacy CDMS
Document Type
Other
Date Acquired
August 3, 2013
Publication Date
April 1, 1966
Subject Category
Instrumentation And Photography
Accession Number
66N28792
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
CRYSTAL SURFACE
ELASTIC SCATTERING
ELECTRON SCATTERING
SECONDARY EMISSION
SPECTROMETER
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