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Study of failure and reliability in microelectronic devices Third quarterly reportFailure analyses on eleven microelectronic devices subjected to temperature-stress cycling, and life testing
Document ID
19660023473
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
August 3, 2013
Publication Date
May 1, 1966
Subject Category
Electronic Equipment
Report/Patent Number
TR-2-0426
NASA-CR-76883
Report Number: TR-2-0426
Report Number: NASA-CR-76883
Accession Number
66N32763
Funding Number(s)
CONTRACT_GRANT: NAS12-72
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
MICROMINIATURIZED ELECTRONIC EQUIPMENT
FAILURE MODE
FATIGUE
THERMAL CYCLING

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