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Study of failure and reliability in microelectronics devices Second quarterly reportFailure analyses on microelectronic devices subjected to temperature-stress cycling, and life testing
Document ID
19660023475
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
August 3, 2013
Publication Date
February 1, 1966
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-76882
Report Number: NASA-CR-76882
Accession Number
66N32765
Funding Number(s)
CONTRACT_GRANT: NAS12-72
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
MICROMINIATURIZED ELECTRONIC EQUIPMENT
FAILURE MODE
THERMAL CYCLING
FATIGUE

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