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Chemical Analysis of Surfaces Using Alpha ParticlesChemical analysis of surfaces using alpha particle interactions in instruments incorporating curium 242 alpha sources and semiconductor silicon detectors
Document ID
19660023878
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Franzgrote, E. (JET PROPULSION LAB.)
Patterson, J. H. (ARGONNE NATL. LAB.)
Turkevich, A. L. (Chicago Univ. Chicago, IL, United States)
Date Acquired
August 3, 2013
Publication Date
July 1, 1964
Subject Category
Chemistry
Report/Patent Number
EFINS-64-42
NASA-CR-59458
Report Number: EFINS-64-42
Report Number: NASA-CR-59458
Accession Number
66N33168
Funding Number(s)
CONTRACT_GRANT: NSG-127-61
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
PARTICLE DETECTOR
CHEMICAL ANALYSIS
SURFACE PROPERTY
ALPHA RADIATION

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