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Improvements in electronic component testingImproved nondestructive test methods using infrared radiation and radioisotope tracers for seal defects and integrated circuit quality control
Document ID
19660026689
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Berkebile, M. J. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 3, 2013
Publication Date
January 1, 1965
Subject Category
Electronic Equipment
Accession Number
66N35979
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
NONDESTRUCTIVE TESTING
INTEGRATED CIRCUIT
TEST METHOD
INFRARED RADIATION
QUALITY CONTROL
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