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Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysisOverlay copy technique to provide high-contrast electron micrographs for automatically determining quantitative microstructure of multiphase specimens
Document ID
19660028391
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Technical Note (TN)
Authors
Cremens, W. S. (NASA Lewis Research Center Cleveland, OH, United States)
Norris, L. F. (NASA Lewis Research Center Cleveland, OH, United States)
Weeton, J. W. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
October 1, 1966
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TN-D-3658
Report Number: NASA-TN-D-3658
Accession Number
66N37681
Funding Number(s)
CONTRACT_GRANT: 129-03-01-05-22
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
NICKEL
MICROANALYSIS
MICROSTRUCTURE
SCANNING DEVICE

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