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Surface state density variations on MOS STRUCTURES due to gamma radiation.Surface state density variations on metal oxide semiconductor capacitors due to gamma radiation
Document ID
19660037356
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Lade, R. W.
Mattauch, R. J.
Date Acquired
August 3, 2013
Publication Date
November 1, 1965
Subject Category
Physics, Solid-State
Accession Number
66A16646
Funding Number(s)
CONTRACT_GRANT: NSG-588
Distribution Limits
Public
Copyright
Other
Keywords
CAPACITOR
METAL OXIDE SEMICONDUCTOR /MOS/
GAMMA RADIATION

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