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Critical excitation function of distributed- parameter devices.Critical excitation function used to estimate transient response of thin film devices at time intervals exceeding greatest time constant
Document ID
19660049605
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Happ, W. W.
Staudhammer, J.
Date Acquired
August 3, 2013
Publication Date
March 1, 1966
Subject Category
Electronic Equipment
Accession Number
66A28895
Distribution Limits
Public
Copyright
Other
Keywords
THIN FILM
RC NETWORK
TRANSISTOR CIRCUIT
TRANSIENT RESPONSE

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