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Yield and angular distribution of cesium sputtered copper using a radioactive tracer technique.Radioactive tracer technique to measure yield and angular distribution of copper sputtered from monocrystalline target subject to cesium ion bombardment
Document ID
19660050000
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Olson, N. T.
Smith, H. P., Jr.
Date Acquired
August 3, 2013
Publication Date
May 1, 1966
Subject Category
Physics, Solid-State
Report/Patent Number
AIAA PAPER 65-379
Report Number: AIAA PAPER 65-379
Accession Number
66A29290
Funding Number(s)
CONTRACT_GRANT: NAS3-5743
Distribution Limits
Public
Copyright
Other
Keywords
COPPER
CESIUM ION
ION BOMBARDMENT
SPUTTERING

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