NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Double-layer interference in air-CdS films.Optical thickness measurement of nonabsorbing dielectric film when it is inconvenient to apply overlay film to measure thickness by Fizeau fringe shift
Document ID
19660061599
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Gottling, J. G.
Nicol, W. S.
Date Acquired
August 3, 2013
Publication Date
September 1, 1966
Publication Information
Publication: OPTICAL SOCIETY OF AMERICA
Subject Category
Physics, Solid-State
Accession Number
66A40889
Funding Number(s)
CONTRACT_GRANT: NSG-496
Distribution Limits
Public
Copyright
Other
Keywords
CADMIUM SULFIDE
FRESNEL REFLECTOR
FILM THICKNESS
DIELECTRIC MATERIAL
OPTICAL THICKNESS

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available