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Instrument sequentially samples ac signals from several accelerometersScanner circuit sequentially samples the ac signals from accelerometers used in conducting noise vibration tests, and provides a time-averaged output signal. The scanner is used in conjunction with other devices for random noise vibration tests.
Document ID
19670000029
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Chapman, C. P.
Date Acquired
August 3, 2013
Publication Date
February 1, 1967
Subject Category
Electronic Components And Circuits
Report/Patent Number
JPL-884
Report Number: JPL-884
Accession Number
67B10029
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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