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Alpha particle backscattering measurements used for chemical analysis of surfacesAlpha particle backscattering performs a chemical analysis of surfaces. The apparatus uses a curium source and a semiconductor detector to determine the energy spectrum of the particles. This in turn determines the chemical composition of the surface after calibration to known samples.
Document ID
19670000186
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Patterson, J. H.
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Subject Category
Materials
Report/Patent Number
ARG-116
Report Number: ARG-116
Accession Number
67B10186
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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