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Circuit measures hysteresis loop areas at 30 HzAnalog circuit measures hysteresis loop areas as a function of time during fatigue testing of specimens subjected to sinusoidal tension-compression stresses at a frequency of Hz. When the sinusoidal stress signal is multiplied by the strain signal, the dc signal is proportional to hysteresis loop area.
Document ID
19670000518
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hoffman, C.
Spilo, D.
Date Acquired
August 3, 2013
Publication Date
October 1, 1967
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-13069
Report Number: MFS-13069
Accession Number
67B10519
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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