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Accelerated life testing of transistorsAccelerated life testing of transistors
Document ID
19670002784
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Klippenstein, E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 3, 2013
Publication Date
August 31, 1966
Subject Category
Electronic Equipment
Accession Number
67N12113
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
TEST METHOD
TRANSISTOR
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