Project ''diode reliability prediction technique''

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Mathematical models for predicting reliability of semiconductor diodes

Document ID

19670007341

Acquisition Source

Legacy CDMS

Document Type

Contractor Report (CR)

Authors

Date Acquired

August 3, 2013

Publication Date

February 1, 1967

Subject Category

Report/Patent Number

Accession Number

67N16670

Funding Number(s)

Distribution Limits

Public

Work of the US Gov. Public Use Permitted.

Keywords

Name

Type

STI

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