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Fast scan infrared microscope for improving microelectronic device reliabilityFast scan infrared microscope to determine thermal and electromechanical parameters affecting reliability of microelectronic components
Document ID
19670014346
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Hamiter, L. C., Jr.
Date Acquired
August 3, 2013
Publication Date
January 1, 1967
Subject Category
Electronic Equipment
Accession Number
67N23675
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
INFRARED INSPECTION
COMPONENT RELIABILITY
MICROELECTRONICS
THERMAL PROPERTY
ELECTROMECHANICS
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