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A study of defect structures with the field ion microscope Semiannual report, Sep. 1, 1966 - Feb. 28, 1967Defect structures in ion emission images of metals and stress distributions under imaging conditions studied with field ion microscope
Document ID
19670018045
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Hren, J. J. (Florida Univ. Gainesville, FL, United States)
Newman, R. W. (Florida Univ. Gainesville, FL, United States)
Sanwald, R. C. (Florida Univ. Gainesville, FL, United States)
Date Acquired
August 3, 2013
Publication Date
February 28, 1967
Subject Category
Physics, General
Report/Patent Number
SAR-2
NASA-CR-84415
Report Number: SAR-2
Report Number: NASA-CR-84415
Accession Number
67N27374
Funding Number(s)
CONTRACT_GRANT: NGR-10-005-039
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
ION MICROSCOPE
ION EMISSION
STRESS DISTRIBUTION
CRYSTAL STRUCTURE DEFECT

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