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Study of metallurgical problems related to microelectronic reliabilityMetallurgical methods for detection and analysis of failure mechanisms in microelectronic devices
Document ID
19670022237
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Beatty, R. P. (NASA Electronics Research Center Cambridge, MA, United States)
Cline, J. E. (NASA Electronics Research Center Cambridge, MA, United States)
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Subject Category
Electronic Equipment
Accession Number
67N31566
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
COMPONENT RELIABILITY
TEST METHOD
METALLURGY
SPACECRAFT ELECTRONIC EQUIPMENT
FAILURE
MICROELECTRONICS
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