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Desensitizing of microcircuits to variations in temperature and production spread. Phase III - Computer aided sensitivity analysisDesensitizing microcircuits to variations in temperature and performance parameters - computer aided sensitivity analysis
Document ID
19670022255
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Carpenter, R. M. (NASA Electronics Research Center Cambridge, MA, United States)
Hartman, W. F. (NASA Electronics Research Center Cambridge, MA, United States)
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Subject Category
Electronic Equipment
Accession Number
67N31584
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
MICROCIRCUIT
TEST METHOD
ELECTRONIC EQUIPMENT TESTING
SENSITIVITY
COMPUTER PROGRAM
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