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Desensitizing of microcircuits to variations in temperature and production spread. Phase IV - Tolerance in performance criteria due to production spread of parametersDesensitizing microcircuits to variations in temperature and production spread - tolerance in performance criteria due to production spread of parameters
Document ID
19670022256
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Carpenter, R. M. (NASA Electronics Research Center Cambridge, MA, United States)
Rombalski, W. (NASA Electronics Research Center Cambridge, MA, United States)
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Subject Category
Electronic Equipment
Accession Number
67N31585
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
TEST METHOD
SENSITIVITY
ELECTRONIC EQUIPMENT TESTING
COMPUTER PROGRAM
COMPONENT RELIABILITY
MICROCIRCUIT
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