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Investigating the potential reliability of integrated circuits from parameter distributionsDistribution plots of electrical parameters as means of investigating potential reliability of integrated circuits
Document ID
19670022273
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Milteer, H. B. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Subject Category
Electronic Equipment
Accession Number
67N31602
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
CURRENT DISTRIBUTION
PLOTTING
TEST METHOD
NORMAL DISTRIBUTION
INTEGRATED CIRCUIT
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