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Design and develop fast scan infrared detection and measuring instrument. Phase IV - Experimental studyFast scan infrared detection and measuring instrument to predict failure of power transistors
Document ID
19670022394
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Dostoomian, A. S. (Raytheon Co. Wayland, MA, United States)
Vanzetti, R. (Raytheon Co. Wayland, MA, United States)
Date Acquired
August 3, 2013
Publication Date
May 15, 1967
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-85602
Report Number: NASA-CR-85602
Accession Number
67N31723
Funding Number(s)
CONTRACT_GRANT: NAS8-11604
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
INFRARED DETECTOR
SCANNING DEVICE
TRANSISTOR
FAILURE

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