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SiO2/Si interface states at 77 deg KSilicon oxide-silicon interface states at 77 degrees K
Document ID
19670030532
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Caban-Zeda, H. P. (Case Inst. of Tech. Cleveland, OH, United States)
Greenstein, E. (Case Inst. of Tech. Cleveland, OH, United States)
Kuper, A. B. (Case Inst. of Tech. Cleveland, OH, United States)
Date Acquired
August 3, 2013
Publication Date
January 1, 1967
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-89741
Report Number: NASA-CR-89741
Accession Number
67N39861
Funding Number(s)
CONTRACT_GRANT: NGR-36-003-067
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
SILICON OXIDE
THERMAL PROPERTY
INTERFACE

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