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Microinhomogeneity problems in silicon.Electron microscopy analysis of microinhomogeneities in commercial Si used in preparation of p-n junction devices
Document ID
19670033705
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Faust, J. W., Jr.
John, H. F.
Stickler, R.
Date Acquired
August 3, 2013
Publication Date
September 1, 1966
Publication Information
Publication: IEEE TRANSACTIONS ON PARTS
Subject Category
Materials, Nonmetallic
Accession Number
67A12434
Funding Number(s)
CONTRACT_GRANT: NAS8-11432
Distribution Limits
Public
Copyright
Other
Keywords
INHOMOGENEITY
ELECTRON MICROSCOPY
P-N JUNCTION
SILICON

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