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Low-temperature spectral emittance measurements.Optical properties of semiconductors by measuring spectral emittance of transparent and opaque solids and measurements on materials used in IR OPTICS
Document ID
19670034305
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Stierwalt, D. L.
Date Acquired
August 3, 2013
Publication Date
January 1, 1966
Subject Category
Instrumentation And Photography
Report/Patent Number
AIAA PAPER 65-654
Report Number: AIAA PAPER 65-654
Accession Number
67A13034
Distribution Limits
Public
Copyright
Other
Keywords
SEMICONDUCTOR
MEASURING APPARATUS
SPECTRAL EMISSION
TEMPERATURE EFFECT
OPTICAL PROPERTY

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