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Attenuation length measurements of photoexcited electrons in CuBr films.Attenuation length of photoexcited electrons in evaporated layers of CuBr estimated by measuring photoemission yield as function of thickness
Document ID
19670035603
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Pong, W.
Date Acquired
August 3, 2013
Publication Date
July 1, 1966
Publication Information
Publication: JOURNAL OF APPLIED PHYSICS
Subject Category
Physics, Solid-State
Accession Number
67A14332
Funding Number(s)
CONTRACT_GRANT: NSG-328
Distribution Limits
Public
Copyright
Other
Keywords
FILM THICKNESS
OPTICAL ABSORPTION
COPPER COMPOUND
PHOTON ABSORPTION
PHOTOELECTRIC EMISSION

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