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Mechanisms of ionizing radiation surface effects on transistors.Ionizing radiation effects on silicon planar bipolar transistors determine degradation mechanisms
Document ID
19670036978
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Nelson, D. L.
Sweet, R. J.
Date Acquired
August 3, 2013
Publication Date
December 1, 1966
Publication Information
Publication: /INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Subject Category
Electronic Equipment
Accession Number
67A15707
Funding Number(s)
CONTRACT_GRANT: NAS8-20135
Distribution Limits
Public
Copyright
Other
Keywords
SILICON TRANSISTOR
IONIZING RADIATION
DEGRADATION
METAL OXIDE SEMICONDUCTOR /MOS/
RADIATION EFFECT

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