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Breakdown conduction in Al-SiO-Al capacitors.Destructive breakdown conduction in aluminum- silicon oxide-aluminum capacitors, discussing voltage threshold, etc
Document ID
19670055901
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1063/1.1710011
Authors
Budenstein, P. P.
Hayes, P. J.
Date Acquired
August 3, 2013
Publication Date
June 1, 1967
Publication Information
Publication: JOURNAL OF APPLIED PHYSICS
Subject Category
Physics, Solid-State
Accession Number
67A34630
Distribution Limits
Public
Copyright
Other
Keywords
THRESHOLD CURRENT
ELECTRIC BREAKDOWN
CAPACITOR

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