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Selected-area small-angle electron diffraction.Selected-area small angle electron diffraction using double-condenser electron microscope, noting high resolution power
Document ID
19670060832
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Geil, P. H.
Yeh, G. S. Y.
Date Acquired
August 3, 2013
Publication Date
September 1, 1967
Publication Information
Publication: JOURNAL OF MATERIALS SCIENCE
Subject Category
Instrumentation And Photography
Accession Number
67A39561
Distribution Limits
Public
Copyright
Other
Keywords
ELECTRON MICROSCOPE
RESOLVING POWER
ELECTRON DIFFRACTION

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