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Dc pin-to-pin testing of integrated circuitsExternal pin-to-pin nondestructive testing procedure measures the electrical characteristics of each element in an integrated circuit. The procedure involves choosing specific pairs of pins and applying appropriate test voltages to them.
Document ID
19680000001
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Thomas, E. F.
Date Acquired
August 4, 2013
Publication Date
January 1, 1968
Subject Category
Electronic Components And Circuits
Report/Patent Number
GSC-10284
Report Number: GSC-10284
Accession Number
68B10001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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