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Development of biaxial test fixture includes cryogenic applicationTest fixture has the capability of producing biaxial stress fields in test specimens to the point of failure. It determines biaxial stress by dividing the applied load by the net cross section. With modification it can evaluate materials, design concepts, and production hardware at cryogenic temperatures.
Document ID
19680000070
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Helf, J. C.
Kelly, R. E.
Kerr, D. A.
Waldron, C. R.
Date Acquired
August 4, 2013
Publication Date
April 1, 1968
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-14189
MFS-14185
Report Number: MFS-14189
Report Number: MFS-14185
Accession Number
68B10070
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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