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Improved S/N meterSignal-to-noise ratios /S/N/ meter containing a variable-frequency notch filter measures noise plus interference in the presence of carrier or modulation signals. A noise source and calibration signal source are included in the instrument for calibration purposes.
Document ID
19680000151
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Windett, C. B.
Date Acquired
August 4, 2013
Publication Date
May 1, 1968
Subject Category
Electronic Components And Circuits
Report/Patent Number
MSC-11656
Report Number: MSC-11656
Accession Number
68B10151
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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