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Vacuum probe sampler removes micron-sized particles from surfacesVacuum probe sampler removes micron-sized particles from sensitive surfaces, without damage to the surface. The probe has a critical orifice to ensure an optimum airflow rate that disturbs the boundary layer of air and raises bacteria from the surface into the probe with the moving air stream.
Document ID
19680000231
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Whitfield, W. J.
Date Acquired
August 4, 2013
Publication Date
July 1, 1968
Subject Category
Life Sciences
Report/Patent Number
SAN-10003
Report Number: SAN-10003
Accession Number
68B10231
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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