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Electron microbeam testing of integrated circuitsElectron microbeam testing of integrated circuits
Document ID
19680006873
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Crawford, L. K. (Massachusetts Inst. of Tech. Cambridge, MA, United States)
Date Acquired
August 4, 2013
Publication Date
February 1, 1968
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-86026
TR-2
Report Number: NASA-CR-86026
Report Number: TR-2
Accession Number
68N16342
Funding Number(s)
CONTRACT_GRANT: NAS12-558
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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