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External visual inspection criteria for semiconductor devicesExternal visual inspection criteria for semiconductor devices
Document ID
19680010120
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Cole, C. G. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Hamiter, L. C., Jr. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Nowakowski, M. F. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 2, 2013
Publication Date
November 28, 1966
Subject Category
Electronic Equipment
Report/Patent Number
SR-QUAL-66-21
NASA-TM-X-60946
Accession Number
68N19589
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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