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Pulse noise immunity in saturated logic gates.Pulse noise immunity of saturated logic gates assessed to determine operational reliability
Document ID
19680034654
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ghandhi, S. K.
Thiel, F. L.
Date Acquired
August 4, 2013
Publication Date
September 1, 1967
Publication Information
Publisher: IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. SC-2, P. 81-86. 7
Subject Category
Electronic Equipment
Accession Number
68A15626
Distribution Limits
Public
Copyright
Other

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