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Problems with dielectric measurements at cryogenic temperatures.Dielectric measurements at cryogenic temperatures, noting dielectric losses and leads reaching cryostat bottom
Document ID
19680040723
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Mathes, K. N.
Mcgowan, E. J.
Date Acquired
August 4, 2013
Publication Date
January 1, 1967
Publication Information
Publisher: AMERICAN SOCIETY FOR TESTING AND MATERIALS /ASTM SPECIAL TECHNICAL PUBLICATION NO. 420/, P. 3-17.
Subject Category
Facilities, Research, And Support
Meeting Information
Meeting: ANNUAL MEETING
Location: ATLANTIC CITY, NJ
Start Date: June 26, 1966
End Date: July 1, 1966
Sponsors: AMERICAN SOCIETY FOR TESTING AND MATERIALS
Accession Number
68A21695
Funding Number(s)
CONTRACT_GRANT: NAS8-2442
Distribution Limits
Public
Copyright
Other

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