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The atom-probe field ion microscope.Atom probe field ion microscope combining probe hole FIM and mass spectrometer with single particle sensitivity
Document ID
19680043693
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Mclane, S. B.
Mueller, E. W.
Panitz, J. A.
Date Acquired
August 4, 2013
Publication Date
January 1, 1968
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: FIELD EMISSION SYMPOSIUM
Location: WASHINGTON, DC
Start Date: June 1, 1967
Accession Number
68A24665
Funding Number(s)
CONTRACT_GRANT: NSG/T/-39-009-011
CONTRACT_GRANT: NSG/T/-22
Distribution Limits
Public
Copyright
Other

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